ACCOTEST

AccoTEST

@accotest

Hang Tuah Jaya, Melaka
https://www.accotest.com/
Semiconductor Manufacturing

Overview

About AccoTEST

AccoTEST provides reliable power and integrated circuit ("IC") test solutions for semiconductor testing. Innovating testing technology since 1993, AccoTEST automated test equipment ("ATE") provides leading-edge test systems for the analog, high power, and mixed-signal semiconductor device market.

AccoTEST, a business unit of Beijing Huafeng Test & Control Technology Co., Ltd. (AccoTEST, STAR Market stock code: 688200) is driven by our motto, Make Testing More Valuable. We pride ourselves in continual pursuit of advancement, with our research and development — the largest department — pushing boundaries every day, turning problems into solutions. Our ATE systems are manufactured in our Tianjin, China and Penang, Malaysia production factories and can be found in Asia, North America, Europe, and as far as the continent of Africa.

AccoTEST Technology Malaysia, established in Melaka and Penang, is the Southeast Asia (“SEA”) hub, while further up North, we have AccoTEST Technology Japan as the East Asia hub. We provide test and measurement equipment, software and hardware development services. Both functional and support teams are available to assist the customer base in the region.

Our STS8200 and STS8300 product series garners significant recognition in analog and mixed-signal semiconductor test market due to their outstanding performance and advanced features. Notably, both product series achieved a remarkable milestone by surpassing a cumulative installed capacity of more than 8000 units by 2025.

Headquarters

Hang Tuah Jaya, Melaka

Website

https://www.accotest.com/

Company Size

501-1,000 employees

Industry

Semiconductor Manufacturing

Company Type

Public Company

Founded

1993

Specialties

Semiconductor Test, Analog ATE, Mixed-signal ATE, Power Discrete (MOSFET/IGBT/SiC) Test Solution, WBG Test Solution, SiC Test Solution, GaN Test Solution, Battery Management System (BMS) testing, DrMOS testing, and Wafer testing

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